Advanced analysis for Atom Probe Tomography and Field Ion Microscopy.
Both Atom probe tomography (APT) and Field ion microscopy (FIM) provide a very rich data on materials examined. Often many more physical insights can be gained from these datasets when moved to non-traditional analysis. To this this extent I have worked on many projects which involve slew of data mining and machine learning techniques applied to APT and FIM datasets. These algorithms and routines help us to understand the underlying correlations, or even to do deploy automated analysis protocols to the datasets. Which in turn helps in improving the reliability and reproducibility of the analysed data.
New Journal of Physics • Mar 2024
Field evaporation from ionic or covalently bonded materials often leads to the emission of molecular ions. The metastability of these molecular ions...
Microscopy and Microanalysis • Aug 2023
The paper introduces a multi-stage machine learning strategy that semi-automates this process by initially transforming APT data into voxels...
Materials Characterization • Mar 2018
Field ion microscopy (FIM) is a technique that captures images of individual surface atoms using a strong electric field...