Both Atom probe tomography (APT) and Field ion microscopy (FIM) provide a very rich data on materials examined. Often many more physical insights can be gained from these datasets when moved to non-traditional analysis. To this this extent I have worked on many projects which involve slew of data mining and machine learning techniques applied to APT and FIM datasets. These algorithms and routines help us to understand the underlying correlations, or even to do deploy automated analysis protocols to the datasets. Which in turn helps in improving the reliability and reproducibility of the analysed data.